Analyze the chemical structure.
After measurement, the mass spectra of any region can be extracted during post data processing.
In TOF-SIMS, deep structures were obtained through repeated measurements and sputtering.
thisDuring this period, all mass spectra will be saved, and after completing the measurement, at any depthMass spectrometry can be extracted during post data processing.
The data of the depth profile is derived from the changes in the sample structure as the depth changesAfter completing in-depth analysis, not only can internal information be obtained,
The information of three-dimensional construction can also beTo obtain.
Two types of standard sample crystal holders are provided, with a diameter of 25mm. The sample crystal is installed and fixed on the back of the sample crystal holder (Back mount),
A sample holder that can hold a sample for easy alignment with the height of the sample crystal. There are also samples installed directly on the front of the sample crystal holder, which can be placed just like the sample crystal holder
Cooling with liquid nitrogen and heating the sample stage with a heater can be controlled between -150t and 200t. The sample crystal holder is equipped with a temperature sensing device, when the sample crystal
At the beginning of the injection room, the software immediately displays real-time temperature readings. Additionally, a sample crystal holder with a capacity of up to 600t for heating can also be selected.
